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  • Proceedings Article January 01, 2002

    A. Shinneeb; J. D. Bugg; R. Balachandar

    Proc. ASME. 36169; Volume 2: Symposia and General Papers, Parts A and B:87-93.January 01, 2002
    FEDSM2002-31160
    doi: 10.1115/FEDSM2002-31160

    TOPICS: Measurement