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The Modeling of Thin Liquid Films Along Inclined Surfaces

[+] Author Affiliations
Michael Z. Podowski

Rensselaer Polytechnic Institute, Troy, NY

Anela Kumbaro

Commisariat de l’Energie Atomic, Saclay, France

Paper No. FEDSM2003-45545, pp. 1637-1644; 8 pages
doi:10.1115/FEDSM2003-45545
From:
  • ASME/JSME 2003 4th Joint Fluids Summer Engineering Conference
  • Volume 1: Fora, Parts A, B, C, and D
  • Honolulu, Hawaii, USA, July 6–10, 2003
  • Conference Sponsors: Fluids Engineering Division
  • ISBN: 0-7918-3696-7 | eISBN: 0-7918-3673-8
  • Copyright © 2003 by ASME

abstract

This paper is concerned with the analysis of thin and ultra-thin liquid films. The results are applicable to various geometrical and kinematic conditions, including both stationary and moving surfaces. The new results obtained in this work include: • the derivation of an analytical solution for the evolution of film thickness over the entire multiscale range, from the liquid free surface to the asymptotic (disjoining-pressure controlled) region, and for any surface inclination angle between 0° to 90°, • the formulation of a method to deduce the Hamaker constant based on a single measured value of film thickness at the beginning of the disjoining-pressure-controlled region, applicable to any inclination angle, • the explanation of the reasons why the thickness of liquid films on moving surfaces is normally beyond the range of Van der Waals forces, • the formulation of an expression for the nondimensional asymptotic film thickness as a function of the capillary number; this new result explicitly accounts for the effect of gravity on the average film velocity.

Copyright © 2003 by ASME

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