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  • Proceedings Article January 01, 2009

    Christopher J. Hall; Daniel Morgan; Austin Jensen; Haiyang Chao; Calvin Coopmans; Mitchel Humpherys; YangQuan Chen

    Proc. ASME. 49002; Volume 3: ASME/IEEE 2009 International Conference on Mechatronic and Embedded Systems and Applications; 20th Reliability, Stress Analysis, and Failure Prevention Conference:575-584.January 01, 2009
    DETC2009-86500
    doi: 10.1115/DETC2009-86500