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Using Surface Characterization for Engineering Education Laboratories

[+] Author Affiliations
Michael G. Mauk, Richard Y. Chiou, Shraman Kadapa, Yalcin Ertekin

Drexel University, Philadelphia, PA

Tzu-Liang (Bill) Tseng

University of Texas at El Paso, El Paso, TX

Paper No. IMECE2017-72264, pp. V005T06A040; 8 pages
doi:10.1115/IMECE2017-72264
From:
  • ASME 2017 International Mechanical Engineering Congress and Exposition
  • Volume 5: Education and Globalization
  • Tampa, Florida, USA, November 3–9, 2017
  • Conference Sponsors: ASME
  • ISBN: 978-0-7918-5840-0
  • Copyright © 2017 by ASME

abstract

A suite of surface measurement methods are described, assessed and compared for several types of materials of technological interest including silicon for solar cells, machined metal surfaces, and rapid prototyped (e.g., 3d-printed) plastic parts. We describe student laboratory projects for surface roughness characterization using different techniques including depth gauge, stylus profilometer, atomic force microscope (AFM), glossmeter, LED light scattering, laser light scattering, image processing, and wetting angle measurements. This provides instructive case studies for learning concepts of surface characterization and metrology, comparing information gained by different measurement techniques, gauge reproducibility and repeatability, optimizing post-processing in rapid prototyping, and issues for adapting measurements for automated and in-line quality assurance.

Copyright © 2017 by ASME

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