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Stress Intensity Factor Solutions for Subsurface Flaws in Plates Subjected to Polynomial Stress Distributions

[+] Author Affiliations
Kai Lu, Jinya Katsuyama, Yinsheng Li

Japan Atomic Energy Agency, Tokai-Mura, Japan

Fuminori Iwamatsu

Hitachi, Ltd., Hitachi, Japan

Paper No. PVP2016-63479, pp. V01AT01A013; 7 pages
doi:10.1115/PVP2016-63479
From:
  • ASME 2016 Pressure Vessels and Piping Conference
  • Volume 1A: Codes and Standards
  • Vancouver, British Columbia, Canada, July 17–21, 2016
  • Conference Sponsors: Pressure Vessels and Piping Division
  • ISBN: 978-0-7918-5035-0
  • Copyright © 2016 by ASME

abstract

Stress intensity factor (SIF) solutions for subsurface flaws near the free surface in plates were numerically investigated based on the finite element analyses. The flaws with aspect ratios a/ℓ = 0, 0.1, 0.2, 0.3, 0.4 and 0.5, the normalized ratios a/d = 0, 0.1, 0.2, 0.4, 0.6 and 0.8 and d/t = 0.01 and 0.1 were taken into account, where a is the half flaw depth, ℓ is the flaw length, d is the distance from the center of the subsurface flaw to the nearest free surface and t is the wall thickness. Fourth-order polynomial stress distributions in the thickness direction were considered. Based on the results, it can be concluded that the numerical SIF solutions obtained in this study are useful in engineering applications.

Copyright © 2016 by ASME

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