Full Content is available to subscribers

Subscribe/Learn More  >

Anand Viscoplasticity Model for the Effect of Aging on Mechanical Behavior of SAC305 Operating at High Strain Rate and High Temperature

[+] Author Affiliations
Pradeep Lall, Di Zhang, Jeff Suhling

Auburn University, Auburn, AL

David Locker

US ARMY AMRDEC, Huntsville, AL

Paper No. IMECE2015-53751, pp. V010T13A023; 11 pages
  • ASME 2015 International Mechanical Engineering Congress and Exposition
  • Volume 10: Micro- and Nano-Systems Engineering and Packaging
  • Houston, Texas, USA, November 13–19, 2015
  • Conference Sponsors: ASME
  • ISBN: 978-0-7918-5753-3
  • Copyright © 2015 by ASME


Portable products such as smartphones and tablets stay in the powered on condition for a majority of their operational life during which time the device internals are maintained at higher than ambient temperature. Thus, it would be expected for interconnects in portable products to be at a temperature high than room temperature when subjected to accidental drop or shock. Furthermore, electronics in missile-applications may be subjected to high strain rates after prolonged period of storage often at high temperature. Electronics systems including interconnects may experience high strain rates in the neighborhood of 1–100 per sec during operation at high temperature. However, the material properties of SAC305 leadfree solders at high strain rates and high operating temperatures are scarce after long-term storage. Furthermore, the solder interconnects in simulation of product drop are often modeled using elastic-plastic properties or linear elastic properties, neither of which accommodate the effect of operating temperature on the solder interconnect deformation at high operating temperature. SAC305 solders have been shown to demonstrate the significant degradation of mechanical properties including the tensile strength and the elastic modulus after exposure to high temperature storage for moderate periods of time. Previously, Anand’s viscoplastic constitutive model has been widely used to describe the inelastic deformation behavior of solders in electronic components under thermo-mechanical deformation. Uniaxial stress-strain curves have been plotted over a wide range of strain rates (ε̇ = 10, 35, 50, 75 /sec) and temperatures (T = 25, 50, 75, 100, 125°C). Anand viscoplasticity constants have been calculated by non-linear fitting procedures. In addition, the accuracy of the extracted Anand constants has been evaluated by comparing the model prediction and experimental data.

Copyright © 2015 by ASME



Interactive Graphics


Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In