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Reconstructing the Designers Intention for Reusing Failure Information

[+] Author Affiliations
Kenji Iino

SYDROSE LP, San Jose, CA

Masayuki Nakao

The University of Tokyo, Tokyo, Japan

Michelle Lovella M. Ota

SYDROSE LP, Tokyo, Japan

Paper No. DETC2014-34577, pp. V004T06A037; 8 pages
doi:10.1115/DETC2014-34577
From:
  • ASME 2014 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
  • Volume 4: 19th Design for Manufacturing and the Life Cycle Conference; 8th International Conference on Micro- and Nanosystems
  • Buffalo, New York, USA, August 17–20, 2014
  • Conference Sponsors: Design Engineering Division, Computers and Information in Engineering Division
  • ISBN: 978-0-7918-4635-3
  • Copyright © 2014 by ASME

abstract

The function-structure (F-S) Map expresses the high-level structure of a design. It is often used in the early stage of conceptual design and serves as the starting point for a number of design tools like quality function deployment, failure mode and effects analysis, and more. On the other hand, in designing risk products whose failure can result in serious damage to the quality of human health or the society, the designer often uses tools like failure mode and effect analysis or fault tree analysis to detect weaknesses in design before the products are shaped. Failures, nonetheless, take place and cause negative impact to the society. It is then that the designer or other experts review the design to find flaws in the failure analysis tree or find elements or links in the graph that the designer overlooked. In other words, pre-production failure analysis is limited to the designer’s knowledge and insight. This paper proposes a way to make use of failure knowledge with past accident cases by constructing the F-S Map for the failed products and storing the information in a failure database. Designers can then compare the F-S Map for new products with linked representation of past failure cases and realize scenarios of failure he did not recognize or have to design carefully.

Copyright © 2014 by ASME
Topics: Failure

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