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MEMS Nanopositioner for Lissajous-Scan Atomic Force Microscopy

[+] Author Affiliations
Anthony G. Fowler, Mohammad Maroufi, Ali Bazaei, S. O. Reza Moheimani

University of Newcastle, Callaghan, NSW, Australia

Paper No. DSCC2014-6044, pp. V003T44A004; 5 pages
doi:10.1115/DSCC2014-6044
From:
  • ASME 2014 Dynamic Systems and Control Conference
  • Volume 3: Industrial Applications; Modeling for Oil and Gas, Control and Validation, Estimation, and Control of Automotive Systems; Multi-Agent and Networked Systems; Control System Design; Physical Human-Robot Interaction; Rehabilitation Robotics; Sensing and Actuation for Control; Biomedical Systems; Time Delay Systems and Stability; Unmanned Ground and Surface Robotics; Vehicle Motion Controls; Vibration Analysis and Isolation; Vibration and Control for Energy Harvesting; Wind Energy
  • San Antonio, Texas, USA, October 22–24, 2014
  • Conference Sponsors: Dynamic Systems and Control Division
  • ISBN: 978-0-7918-4620-9
  • Copyright © 2014 by ASME

abstract

This paper presents a new silicon-on-insulator-based MEMS nanopositioner that is designed for high-speed on-chip atomic force microscopy (AFM). The device features four electrostatic actuators in a 2-DOF configuration that allows bidirectional actuation of a central stage along two orthogonal axes with displacements greater than ±10μm. The x- and y-axis resonant modes of the stage are located at 1274Hz and 1286Hz, respectively. Integrated electrothermal sensors are used to control the system in closed loop, with a damping controller and an internal model controller being implemented for each axis. The performance of the closed-loop system is demonstrated by performing a 20μm×20μm contact-mode AFM scan via a Lissajous scan trajectory with a 410Hz sinusoidal reference.

Copyright © 2014 by ASME

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