0

Full Content is available to subscribers

Subscribe/Learn More  >

Quantitative Imaging of Nanoparticles and Intracellular Vesicle Trafficking Using Total Internal Reflection Fluorescent Microscopy (TIRFM)

[+] Author Affiliations
Charles H. Margraves, Chang K. Choi, Kenneth D. Kihm, Anthony English, Seong H. Lee, Maria Cekanova, Seung J. Baek

The University of Tennessee, Knoxville, TN

Paper No. SBC2007-176682, pp. 583-584; 2 pages
doi:10.1115/SBC2007-176682
From:
  • ASME 2007 Summer Bioengineering Conference
  • ASME 2007 Summer Bioengineering Conference
  • Keystone, Colorado, USA, June 20–24, 2007
  • Conference Sponsors: Bioengineering Division
  • ISBN: 0-7918-4798-5
  • Copyright © 2007 by ASME

abstract

Total internal reflection fluorescent microscopy (TIRFM) is a relatively well known tool used to examine the near wall region (approximately 1 μm). For years, cellular biologists have used TIRFM in a variety of experiments to examine multiple cell lines. However, much of the research has been somewhat static in nature, considering only initial and final states. With the increased ability to stain specific organelles within cells through the use of green fluorescent protein (GFP), dynamic imaging is becoming a viable solution to previously difficult problems.

Copyright © 2007 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In