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Flatness-Based Open Loop Command Tracking for Quasistatic Microscanners

[+] Author Affiliations
Klaus Janschek

Technische Universität Dresden, Dresden, Germany

Richard Schroedter, Thilo Sandner

Fraunhofer Institute for Photonic Microsystems, Dresden, Germany

Paper No. DSCC2013-3865, pp. V003T37A001; 5 pages
doi:10.1115/DSCC2013-3865
From:
  • ASME 2013 Dynamic Systems and Control Conference
  • Volume 3: Nonlinear Estimation and Control; Optimization and Optimal Control; Piezoelectric Actuation and Nanoscale Control; Robotics and Manipulators; Sensing; System Identification (Estimation for Automotive Applications, Modeling, Therapeutic Control in Bio-Systems); Variable Structure/Sliding-Mode Control; Vehicles and Human Robotics; Vehicle Dynamics and Control; Vehicle Path Planning and Collision Avoidance; Vibrational and Mechanical Systems; Wind Energy Systems and Control
  • Palo Alto, California, USA, October 21–23, 2013
  • Conference Sponsors: Dynamic Systems and Control Division
  • ISBN: 978-0-7918-5614-7
  • Copyright © 2013 by ASME

abstract

This paper describes a nonlinear command tracking scheme for an electrostatic laser scanning micromirror assembly. The results are based on an innovative gimballed comb transducer concept developed at the Fraunhofer Institute for Photonic Microsystems. The outer mirror axis is designed as a Staggered Vertical Comb (SVC) in out-of-plane configuration and it shall provide a quasistatic operation with large deflection angles for triangular trajectories. The challenges for trajectory design and open loop command tracking are determined by the inherently nonlinear transducer characteristics and the lightly damped mass-spring dynamics. In this paper a flatness-based trajectory design is presented that considers the nonlinear transducer dynamics as well as the nonlinear elastic mechanical suspension with model parameters derived from ANSYS analysis. The paper discusses design constraints and detailed design considerations and it shows proof of concept performance results based on experimental verification with a real microscanner assembly.

Copyright © 2013 by ASME

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