0

Full Content is available to subscribers

Subscribe/Learn More  >

A Revised Anand Constitutive Model for Lead Free Solder That Includes Aging Effects

[+] Author Affiliations
Mohammad Motalab, Munshi Basit, Jeffrey C. Suhling, Pradeep Lall

Auburn University, Auburn, AL

Paper No. IPACK2013-73232, pp. V001T05A009; 20 pages
doi:10.1115/IPACK2013-73232
From:
  • ASME 2013 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems
  • Volume 1: Advanced Packaging; Emerging Technologies; Modeling and Simulation; Multi-Physics Based Reliability; MEMS and NEMS; Materials and Processes
  • Burlingame, California, USA, July 16–18, 2013
  • Conference Sponsors: Electronic and Photonic Packaging Division
  • ISBN: 978-0-7918-5575-1
  • Copyright © 2013 by ASME

abstract

Traditional finite element based predictions for solder joint reliability during thermal cycling accelerated life testing are based on solder constitutive equations (e.g. Anand viscoplastic model) and failure models (e.g. energy dissipation per cycle model) that do not evolve with material aging. Thus, there will be significant errors in the calculations with lead free SAC alloys that illustrate dramatic aging phenomena. In this study, we have developed a revised set of Anand viscoplastic stress-strain relations for solder that include material parameters that evolve with the thermal history of the solder material. The effects of aging on the nine Anand model parameters have been examined by performing stress-strain tests on SAC305 samples that were aged for various durations (0–6 months) at temperature of 100 C. The stress-strain data were measured at three strain rates (.001, .0001, and .00001 1/sec) and five temperatures (25, 50, 75, 100, and 125 C). The mechanical tests have been performed using both water quenched (WQ) and reflowed (RF) samples (two unique specimen microstructures). In the case of the water quenched samples, there is rapid microstructural transitioning during the brief time that occurs between placing molten solder into the glass tubes and immersing the tubes in water bath. On the other hand, the reflowed samples are first cooled by water quenching, and then sent through a reflow oven to re-melt the solder in the tubes and subject them to a desired temperature profile matching that used in PCB assembly.

As expected, the observed mechanical properties of water quenched samples were better (higher in magnitude) than the corresponding mechanical properties of the reflowed samples. Although the differences in elastic modulus between the water quenched and reflowed samples are small, significant differences are present for the yield and ultimate tensile stresses (for each aging condition). For both the water quenched and reflowed specimens, significant degradation of the mechanical properties has been observed with aging. Using the measured stress-strain and creep data, mathematical expressions have been developed for the evolution of the Anand model parameter with aging time. Our results show that 2 of the 9 constants remain essentially constant during aging, while the other 7 show large changes (30–70%) with up to 6 months of aging. The revised Anand constitutive equations for solder with aging effects have also been incorporated into commercial finite element codes (ANSYS and ABAQUS).

Copyright © 2013 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In