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The Attachment of Carbon Nanotube on a Blunt AFM Tip Using Electric Fields

[+] Author Affiliations
Hyung Woo Lee, Soon Geun Kwon, Soo Hyun Kim, Yoon Keun Kwak

Korea Advanced Institute of Science and Technology

Chang Soo Han

Korea Institute of Machinery and Materials

Paper No. IMECE2004-61549, pp. 511-515; 5 pages
doi:10.1115/IMECE2004-61549
From:
  • ASME 2004 International Mechanical Engineering Congress and Exposition
  • Electronic and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology
  • Anaheim, California, USA, November 13 – 19, 2004
  • Conference Sponsors: Electronic and Photonic Packaging Division
  • ISBN: 0-7918-4707-1 | eISBN: 0-7918-4178-2, 0-7918-4179-0, 0-7918-4180-4
  • Copyright © 2004 by ASME

abstract

We report a simple, low cost, reliable technique of making carbon nanotube (CNT) modified atomic force microscopy (AFM) tip. We used the dielectrophoresis and the electrophoresis to align and deposit carbon nanotubes on the end of the AFM tip. From the simulation and the various experiments, we obtained the optimal electric condition, 0.32Vpp/μm. Also, we found that the blunt shape of the tip’s apex is more effective than sharpened one. Through the experiments, we verified that the blunt shape is more effective over 50% than the sharpened one in the attachment of CNTs. By comparing the scanning results between the CNT modified tip and a normal AFM tip, we obtained the improvement in efficiency of 23%.

Copyright © 2004 by ASME

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