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Effect of Drop Impact on the Leakage of an Insulin Pump

[+] Author Affiliations
Sheng Liu

Wayne State University

Bin Ma, Honghai Zhang, Zhiyin Gan, Mingcai Zhou, Xiaojun Wang

Huazhong University of Science and Technology

Paper No. IMECE2004-62505, pp. 445-450; 6 pages
  • ASME 2004 International Mechanical Engineering Congress and Exposition
  • Electronic and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology
  • Anaheim, California, USA, November 13 – 19, 2004
  • Conference Sponsors: Electronic and Photonic Packaging Division
  • ISBN: 0-7918-4707-1 | eISBN: 0-7918-4178-2, 0-7918-4179-0, 0-7918-4180-4
  • Copyright © 2004 by ASME


Drop impact to portable medical electronics devices products may cause significant functional and physical damage. It is well known that insulin pumps are susceptible to drop impact which can cause various damage modes such as blending air in insulin liquid, interface breakage, battery separation, possible debonding between syringe and pipe, cracking on the LCD. This paper for the first time examines the insulin pump drop impact orientation and drop heights. A method by actual drop test using a sample pump as an example is proposed. Of interest is the measurement of the level of shock and the impact orientation experienced by the electronic components in the insulin pump during impact. The drop impact responses examined are the impact force and the strains and level of shock induced at the pump’s interfaces. A better understanding of the shock induced at the electronic components and packages in the products can assist manufacturers not only in designing better components and electronic package but also products which are more robust and reliable to handle shock and impact loading. Permanent deformation, stress, strain on the critical parts are examined and the effect on the possible leakage are examined.

Copyright © 2004 by ASME
Topics: Drops , Pumps , Leakage



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