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Nano-PTV Using Confocal Microscopy

[+] Author Affiliations
Jae S. Park, Chang K. Choi, Kenneth D. Kihm

Texas A&M University, College Station, TX

Paper No. HT-FED2004-56653, pp. 551-557; 7 pages
  • ASME 2004 Heat Transfer/Fluids Engineering Summer Conference
  • Volume 4
  • Charlotte, North Carolina, USA, July 11–15, 2004
  • Conference Sponsors: Heat Transfer Division and Fluids Engineering Division
  • ISBN: 0-7918-4693-8 | eISBN: 0-7918-3740-8
  • Copyright © 2004 by ASME


A conventional microscopy and confocal microscopy was used to enable nano-particle tracking using a three-dimensional (3-D) diffraction image pattern caused by an optical aberration. The Point Spread Function (PSF) of a particle image is known as a function of a defocus distance from a focal plane. Using the PSF of nano-particles, particle’s x and y positions as well as z-position can be obtained. A dry objective lens (40X, 0.75NA) is used to detect diffraction patterns of 500-nm fluorescent micro-spheres suspended in water solution inside a 100-μm square micro-tube. The purposes of this presented study are to investigate experimentally the 3-D PSF of fluorescent nano-particle in thick specimen and to develop the 3-D particle tracking technique using 3-D diffraction images of conventional microscopy and CLSM.

Copyright © 2004 by ASME
Topics: Microscopy



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