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Development of an Electronic Speckle Pattern Interferometer for Measurement of Concentration Gradients in a Binary Mixture

[+] Author Affiliations
David McGuire, Julie Garvey, Tara M. Dalton, Mark R. Davies

University of Limerick, Limerick, Ireland

Paper No. HT-FED2004-56604, pp. 407-412; 6 pages
doi:10.1115/HT-FED2004-56604
From:
  • ASME 2004 Heat Transfer/Fluids Engineering Summer Conference
  • Volume 1
  • Charlotte, North Carolina, USA, July 11–15, 2004
  • Conference Sponsors: Heat Transfer Division and Fluids Engineering Division
  • ISBN: 0-7918-4690-3 | eISBN: 0-7918-3740-8
  • Copyright © 2004 by ASME

abstract

This paper describes the construction and performance of an Electronic Speckle Pattern Interferometer (ESPI) developed for measurements of concentration gradients in a binary mixture. The system uses a Mach-Zehnder interferometer with a commercially available CCD camera for image acquisition. A phase-shifting algorithm is employed to give full field measurements. The theoretical background to the optical process involved in these methods is also presented, with emphasis on using the system for analysing concentration gradients. Problems pertaining to the unknown Gladstone-Dale constants of a binary mixture are also discussed.

Copyright © 2004 by ASME
Topics: Interferometers

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