Full Content is available to subscribers

Subscribe/Learn More  >

Development of an Electronic Speckle Pattern Interferometer for Measurement of Concentration Gradients in a Binary Mixture

[+] Author Affiliations
David McGuire, Julie Garvey, Tara M. Dalton, Mark R. Davies

University of Limerick, Limerick, Ireland

Paper No. HT-FED2004-56604, pp. 407-412; 6 pages
  • ASME 2004 Heat Transfer/Fluids Engineering Summer Conference
  • Volume 1
  • Charlotte, North Carolina, USA, July 11–15, 2004
  • Conference Sponsors: Heat Transfer Division and Fluids Engineering Division
  • ISBN: 0-7918-4690-3 | eISBN: 0-7918-3740-8
  • Copyright © 2004 by ASME


This paper describes the construction and performance of an Electronic Speckle Pattern Interferometer (ESPI) developed for measurements of concentration gradients in a binary mixture. The system uses a Mach-Zehnder interferometer with a commercially available CCD camera for image acquisition. A phase-shifting algorithm is employed to give full field measurements. The theoretical background to the optical process involved in these methods is also presented, with emphasis on using the system for analysing concentration gradients. Problems pertaining to the unknown Gladstone-Dale constants of a binary mixture are also discussed.

Copyright © 2004 by ASME
Topics: Interferometers



Interactive Graphics


Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In