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Numerical Analysis of the Band Excitation AFM Method: Examining the Characteristics of the Excitation Signals and the Corresponding Response Behavior at the Cantilever Tip

[+] Author Affiliations
Adam U. Kareem, Santiago D. Solares

University of Maryland at College Park, College Park, MD

Paper No. DETC2011-47167, pp. 379-385; 7 pages
doi:10.1115/DETC2011-47167
From:
  • ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
  • Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference
  • Washington, DC, USA, August 28–31, 2011
  • Conference Sponsors: Design Engineering Division and Computers and Information in Engineering Division
  • ISBN: 978-0-7918-5484-6
  • Copyright © 2011 by ASME

abstract

We present numerical simulations of a recently developed atomic force microscopy (AFM) technique known as the Band Excitation Method, developed by Jesse et al. [2007 Nanotechnology 18 435503]. With this technique an AFM microcantilever is simultaneously excited and the response measured over a continuum band of frequencies. The purpose of this work is to introduce an analytical model providing insight into the dynamics of the Band Excitation Method, which can help in the translation of the acquired signals into sample properties. As an initial step we examine the cantilever response to two distinct excitation signals, the chirp and sinc functions, both of which have uniform frequency content, differing only in the phase content.

Copyright © 2011 by ASME

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