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Thermal Transport Measurements of Nanowire-Substrate Interfaces

[+] Author Affiliations
Monalisa Mazumder, Theodorian Borca-Tasciuc

Rensselaer Polytechnic Institute, Troy, NY

Paper No. HT2008-56328, pp. 365-368; 4 pages
doi:10.1115/HT2008-56328
From:
  • ASME 2008 Heat Transfer Summer Conference collocated with the Fluids Engineering, Energy Sustainability, and 3rd Energy Nanotechnology Conferences
  • Heat Transfer: Volume 1
  • Jacksonville, Florida, USA, August 10–14, 2008
  • Conference Sponsors: Heat Transfer Division
  • ISBN: 978-0-7918-4847-0 | eISBN: 0-7918-3832-3
  • Copyright © 2008 by ASME

abstract

An AFM based method for characterization of thermal transport properties of electrically conductive individual nanowires and nanowire-substrate interfaces has been developed. Nanostructures are located by topographic imaging in regular tapping mode and are then subsequently probed by an AFM cantilever tip, with a conductive coating thus establishing electrical contact at different positions on the nanowire followed by current-voltage data acquisition. This experimental approach can be implemented for a system with nanostructures in contact with the surface and, in the other case, suspended between electrodes. These configurations allow for characterization of both thermal conductivity and nano-interface thermal resistance. This work presents the technique along with the subsequent measurements of nano-interface thermal resistance of nanowire-substrate junction using the aforesaid technique.

Copyright © 2008 by ASME

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