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A Unified Simple Predictive Model for High Fluence Ultra-Short Pulsed Laser Ablation of Metal, Semiconductor and Dielectric

[+] Author Affiliations
Benxin Wu

Illinois Institute of Technology, Chicago, IL

Yung C. Shin

Purdue University, West Lafayette, IN

Paper No. MSEC2009-84317, pp. 853-859; 7 pages
  • ASME 2009 International Manufacturing Science and Engineering Conference
  • ASME 2009 International Manufacturing Science and Engineering Conference, Volume 1
  • West Lafayette, Indiana, USA, October 4–7, 2009
  • Conference Sponsors: Manufacturing Engineering Division
  • ISBN: 978-0-7918-4361-1 | eISBN: 978-0-7918-3859-4
  • Copyright © 2009 by ASME


A unified simple predictive model has been presented for high fluence ultrashort laser ablation of metal, semiconductor and dielectric, which has very low computational cost and is very easy to apply. Unlike many other simplified models, this model does not involve any free adjustable variables. The model predictions agree well with experimental measurements for femtosecond laser ablation, while the model is not very applicable for pulse durations more than ∼10 picosecond.

Copyright © 2009 by ASME



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