0

Full Content is available to subscribers

Subscribe/Learn More  >

Modelling Reliability of Power Electronics Packaging

[+] Author Affiliations
Chris Bailey, Hua Lu, Chunyan Yin

University of Greenwich, London, UK

Paper No. InterPACK2009-89430, pp. 215-220; 6 pages
doi:10.1115/InterPACK2009-89430
From:
  • ASME 2009 InterPACK Conference collocated with the ASME 2009 Summer Heat Transfer Conference and the ASME 2009 3rd International Conference on Energy Sustainability
  • ASME 2009 InterPACK Conference, Volume 2
  • San Francisco, California, USA, July 19–23, 2009
  • Conference Sponsors: Electronic and Photonic Packaging Division
  • ISBN: 978-0-7918-4360-4 | eISBN: 978-0-7918-3851-8
  • Copyright © 2009 by ASME

abstract

Power Electronics uses semiconductor technology to convert and control electrical power. Demands for efficient energy management, conversion and conservation, and the increasing take up of electronics in transport systems (i.e. all electric car) there has been tremendous growth in the use of power electronics semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT’s). The packaging of the power electronics devices involves a number of challenges for design engineers in terms of reliability and thermal management. For example IGBT modules will contain a number of semiconductor dies within a small footprint bonded to substrates with aluminium wires and wide area solder joints. The reliability of the package will depend on thermo-mechanical behavior of these materials. This paper details the results from a major UK project involving academics and industrial partners to investigate the reliability of IGBT modules. The focus of the presentation will be on the modelling tools developed to predict reliability and also the development of prognostics techniques to predict the remaining life of the package.

Copyright © 2009 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In