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Resonant Tunneling Peaks Appeared in the Current: Voltage Characteristics for Polymeric Thin Films

[+] Author Affiliations
Toshiaki Tanaka, Aiko Sato, Hitoshi Asano, Mitsuru Takenaga

Tokyo University of Science, Yamaguchi, SanyoOnoda, Yamaguchi, Japan

Paper No. InterPACK2009-89058, pp. 517-520; 4 pages
doi:10.1115/InterPACK2009-89058
From:
  • ASME 2009 InterPACK Conference collocated with the ASME 2009 Summer Heat Transfer Conference and the ASME 2009 3rd International Conference on Energy Sustainability
  • ASME 2009 InterPACK Conference, Volume 1
  • San Francisco, California, USA, July 19–23, 2009
  • Conference Sponsors: Electronic and Photonic Packaging Division
  • ISBN: 978-0-7918-4359-8 | eISBN: 978-0-7918-3851-8
  • Copyright © 2009 by ASME

abstract

Current-voltage characteristics measured with conductive-atomic force microscopy for polymeric ultrathin films are examined. The polymeric films were prepared with uv-irradiation onto Langmuir-Blodgett films deposited two layers on glass or silicon substrates. The conjugated backbone chains with alkyl side-chains are regularly arranged on the substrate surface. Anomalous current peaks were observed for many samples; and appearance depends on the film structure and interfacial properties between molecules and electrodes. In addition, the steep increase in current occurred at higher applied voltages; values of the threshold electric field were estimated from Fowler-Nordheim plot. Furthermore the resistance between the electrodes decreased with increase in the effective film thickness.

Copyright © 2009 by ASME

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