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Theoretical Investigation of Tip-Based Nanoscale Infrared Spectroscopy

[+] Author Affiliations
William Dipippo, Keunhan Park

University of Rhode Island, Kingston, RI

Bong Jae Lee

University of Pittsburgh, Pittsburgh, PA

Paper No. HT2009-88538, pp. 351-353; 3 pages
doi:10.1115/HT2009-88538
From:
  • ASME 2009 Heat Transfer Summer Conference collocated with the InterPACK09 and 3rd Energy Sustainability Conferences
  • Volume 2: Theory and Fundamental Research; Aerospace Heat Transfer; Gas Turbine Heat Transfer; Computational Heat Transfer
  • San Francisco, California, USA, July 19–23, 2009
  • Conference Sponsors: Heat Transfer Division
  • ISBN: 978-0-7918-4357-4 | eISBN: 978-0-7918-3851-8
  • Copyright © 2009 by ASME

abstract

The ability to conduct the chemical analysis of materials with the nanoscale spatial resolution has been a long term thrust in many science and engineering communities. Although several techniques such as chemical force microscopy [1] and tip-enhanced Raman spectroscopy [2] have been developed for the nanoscale chemical analysis, there still exist technical challenges in routinely achieving a full spectrum of chemical information at the nanoscale. The main objective of this study is to propose a novel tip-based nanoscale infrared (IR) spectroscopy by combining the atomic force microscopy (AFM) and the Fourier-transformed infrared (FT-IR) spectroscopy.

Copyright © 2009 by ASME

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