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Zero-Load Friction at Nanowire-Silicon Interfaces

[+] Author Affiliations
Mohan Manoharan, Aman Haque

Pennsylvania State University, University Park, PA

Paper No. DETC2008-49818, pp. 535-538; 4 pages
doi:10.1115/DETC2008-49818
From:
  • ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
  • Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems
  • Brooklyn, New York, USA, August 3–6, 2008
  • Conference Sponsors: Design Engineering Division and Computers in Engineering Division
  • ISBN: 978-0-7918-4328-4 | eISBN: 0-7918-3831-5
  • Copyright © 2008 by ASME

abstract

The dominance of adhesive forces at the nanoscale implies that significant friction forces can be generated at the interface even with no externally applied normal load. We have nanofabricated an adhesion-friction force sensor to characterize friction in zinc oxide nanowires on silicon substrates. Experimental results show static friction coefficients for zero externally applied normal load can be as high as 45. This behavior is observed to be strongly influenced by the ambient conditions and we propose that the presence of molecularly thin moisture layers is responsible for the observed pseudo-static friction. The findings of this study will provide valuable input to nanoscale interfacial systems such as nanowires and nanotube based sensors and nanocomposites.

Copyright © 2008 by ASME

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