0

Full Content is available to subscribers

Subscribe/Learn More  >

A Two-Temperature Model of Narrow-Body Silicon Transistors Under Steady State and Transient Operation

[+] Author Affiliations
Zhun-Yong Ong, Eric Pop

University of Illinois - Urbana-Champaign, Urbana, IL

Paper No. ENIC2008-53025, pp. 97-108; 12 pages
doi:10.1115/ENIC2008-53025
From:
  • ASME 2008 3rd Energy Nanotechnology International Conference collocated with the Heat Transfer, Fluids Engineering, and Energy Sustainability Conferences
  • ASME 2008 3rd Energy Nanotechnology International Conference
  • Jacksonville, Florida, USA, August 10–14, 2008
  • Conference Sponsors: Nanotechnology Institute
  • ISBN: 0-7918-4323-9 | eISBN: 0-7918-3832-3
  • Copyright © 2008 by ASME

abstract

We present a simple theory of diffusive phonon heat transport in silicon thin films using the Two-Temperature Model (TTM). In silicon thin films, boundary scattering reduces the lifetime and hence, the mean free path of acoustic phonons. As acoustic phonons are responsible for heat transport in silicon, the latter effect leads to a reduction in the lattice thermal conductivity. However, optical phonons are unaffected by boundary scattering. As the boundary scattering rate exceeds the inverse lifetime of acoustic phonons and the energy relaxation rate between optical and acoustic phonons, it results in an energy transfer bottleneck. The reduced lattice thermal conductivity from boundary scattering and the energy transfer bottleneck are taken into account in the TTM. We apply the TTM to find the steady temperature distribution in a 2D model of a silicon-on-insulator (SOI) device. The numerical results are in good agreement with those obtained from the more sophisticated full dispersion model of the Boltzmann Transport Equation (BTE). We apply the TTM to calculate the steady state and transient temperature distributions in a simplified 1D model of a SOI device.

Copyright © 2008 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In