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Near-Field Radiation Between a Sphere and Substrates of Different Materials

[+] Author Affiliations
Sheng Shen, Gang Chen

Massachusetts Institute of Technology, Cambridge, MA

Arvind Narayanaswamy

Columbia University, New York, NY

Paper No. ENIC2008-53004, pp. 71-74; 4 pages
doi:10.1115/ENIC2008-53004
From:
  • ASME 2008 3rd Energy Nanotechnology International Conference collocated with the Heat Transfer, Fluids Engineering, and Energy Sustainability Conferences
  • ASME 2008 3rd Energy Nanotechnology International Conference
  • Jacksonville, Florida, USA, August 10–14, 2008
  • Conference Sponsors: Nanotechnology Institute
  • ISBN: 0-7918-4323-9 | eISBN: 0-7918-3832-3
  • Copyright © 2008 by ASME

abstract

In order to measure the near-field radiative heat transfer between a microsphere and a substrate, we have developed a sensitive technique using a bi-material atomic force microscope (AFM) cantilever. In this paper, we use this technique to measure the near-field radiation between a silica microsphere and substrates made of different materials (semiconductor, metal and polar dielectric materials). The resulting “Conductance-distance” curves show the presence of the near-field radiation enhancement caused by surface phonon-polaritons.

Copyright © 2008 by ASME

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