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Importance Sampling in Monte Carlo Ray Tracing Solutions Applied to Radiation in Hypersonic Entry Flows

[+] Author Affiliations
Andrew Feldick

The Pennsylvania State University, University Park, PA

Michael F. Modest

University of California, Merced, Merced, CA

Paper No. AJTEC2011-44487, pp. T10262-T10262-7; 7 pages
doi:10.1115/AJTEC2011-44487
From:
  • ASME/JSME 2011 8th Thermal Engineering Joint Conference
  • ASME/JSME 2011 8th Thermal Engineering Joint Conference
  • Honolulu, Hawaii, USA, March 13–17, 2011
  • ISBN: 978-0-7918-3892-1 | eISBN: 978-0-7918-3894-5
  • Copyright © 2011 by ASME

abstract

A method for the application of importance sampling to wavelength selection in ray tracing Monte Carlo solvers is introduced. In this method individual lines are treated independently, and probability distribution and weighting functions are applied to individual lines. The method reduces the number of photons required to reach the same statistical precision as the standard Monte Carlo method.

Copyright © 2011 by ASME

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