0

Full Content is available to subscribers

Subscribe/Learn More  >

Thermal Conductivity of Pure Silica MEL and MFI Zeolite Thin Films

[+] Author Affiliations
Thomas Coquil, Laurent Pilon

University of California, Los Angeles, Los Angeles, CA

Christopher M. Lew, Yushan Yan

University of California, Riverside, Riverside, CA

Paper No. IHTC14-23183, pp. 505-511; 7 pages
doi:10.1115/IHTC14-23183
From:
  • 2010 14th International Heat Transfer Conference
  • 2010 14th International Heat Transfer Conference, Volume 6
  • Washington, DC, USA, August 8–13, 2010
  • Conference Sponsors: Heat Transfer Division
  • ISBN: 978-0-7918-4941-5 | eISBN: 978-0-7918-3879-2
  • Copyright © 2010 by ASME

abstract

This paper reports the room temperature cross-plane thermal conductivity of pure silica zeolite (PSZ) MEL and MFI thin films. PSZ MEL thin films were prepared by spin coating a suspension of MEL nanoparticles in 1-butanol solution onto silicon substrates followed by calcination and vapor-phase silylation with trimethylchlorosilane. The mass fraction of nanoparticles within the suspension varied from 16 to 55%. This was achieved by varying the crystallization time of the suspension. The thin films consisted of crystalline MEL nanoparticles embedded in a non-uniform and highly porous silica matrix. They featured porosity, relative crystallinity and MEL nanoparticles size ranging from 40 to 59%, 23 to 47% and 55 to 80 nm, respectively. PSZ MFI thin films were made by in-situ crystallization, were b-oriented, fully crystalline and had a 33% porosity. Thermal conductivity of the PSZ thin films was measured at room temperature using the 3ω method. The cross-plane thermal conductivity of the MEL thin films remained constant around 1.02 ± 0.10 Wm−1 K−1 despite increases in (i) relative crystallinity, (ii) nanoparticle size and (iii) yield as the nanoparticle crystallization time increased. Indeed, the effect of increases in these parameters on the thermal conductivity was compensated by the simultaneous increase in porosity. PSZ MFI thin films were found to have the same thermal conductivity as MEL thin films even though they had smaller porosity. Finally, the average thermal conductivity of the PSZ films was three to five times larger than that reported for amorphous sol-gel mesoporous silica thin films with similar porosity and dielectric constant.

Copyright © 2010 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In