0

Full Content is available to subscribers

Subscribe/Learn More  >

Modeling and Simulation of Non-Contact Atomic Force Microscope

[+] Author Affiliations
Mohammadreza Bahrami, Kambiz Ghaemi Osquie

Sharif University of Technology, International Campus, Kish Island, Iran

Asghar Ramezani

Iran University of Science and Technology; Institute for Research in Fundamental Sciences, Tehran, Iran

Paper No. ESDA2010-24394, pp. 565-569; 5 pages
doi:10.1115/ESDA2010-24394
From:
  • ASME 2010 10th Biennial Conference on Engineering Systems Design and Analysis
  • ASME 2010 10th Biennial Conference on Engineering Systems Design and Analysis, Volume 5
  • Istanbul, Turkey, July 12–14, 2010
  • Conference Sponsors: International
  • ISBN: 978-0-7918-4919-4 | eISBN: 978-0-7918-3877-8
  • Copyright © 2010 by ASME

abstract

The Atomic force microscope in non-contact mode of operation is modeled as a lumped parameter system. The interaction of the cantilever tip with the sample surface through the van der Waals force introduces the nonlinearity to the model. The model is analyzed by the method of multiple scales and the frequency response equation is obtained. The effects of the nonlinearity, amplitude of excitation, and damping coefficient on the frequency response are studied.

Copyright © 2010 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In