0

Full Content is available to subscribers

Subscribe/Learn More  >

Microelectrothermal Bridge Circuits for Thermal Conductivity Measurement of Metallic and Semiconducting Nanowires

[+] Author Affiliations
Nenad Stojanovic, Jordan M. Berg, Mark Holtz

Texas Tech University, Lubbock, TX

D. H. S. Maithripala

University of Peradeniya, Peradeniya, Sri Lanka

Paper No. DSCC2010-4291, pp. 119-124; 6 pages
doi:10.1115/DSCC2010-4291
From:
  • ASME 2010 Dynamic Systems and Control Conference
  • ASME 2010 Dynamic Systems and Control Conference, Volume 2
  • Cambridge, Massachusetts, USA, September 12–15, 2010
  • Conference Sponsors: Dynamic Systems and Control Division
  • ISBN: 978-0-7918-4418-2 | eISBN: 978-0-7918-3884-6
  • Copyright © 2010 by ASME

abstract

We develop a method for direct measurement of thermal conductivity of nanowires, consisting of a microelectrothermal test device and a complementary parameter estimation algorithm. Simulations of a simplified version of the problem show how differential measurements can address the problem of parasitic heat loss, and examine several different parameter estimation schemes. As reported elsewhere, measurements have been performed on aluminum nanowire arrays, with excellent results. Several design modifications are required to accommodate semiconducting samples. A device design for silicon nanowire arrays is presented. A simulation study suggests that these devices will also perform extremely well.

Copyright © 2010 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In