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Development of Neural Probe With Wireless Power Feed

[+] Author Affiliations
Sang H. Choi

NASA Langley Research Center, Hampton, VA

Kyo D. Song

Norfolk State University, Norfolk, VA

Yeonjoon Park

National Institute of Aerospace, Hampton, VA

Uhn Lee

Gachon University of Medicine and Science, Incheon, Korea

Paper No. NEMB2010-13055, pp. 7-10; 4 pages
  • ASME 2010 First Global Congress on NanoEngineering for Medicine and Biology
  • ASME 2010 First Global Congress on NanoEngineering for Medicine and Biology
  • Houston, Texas, USA, February 7–10, 2010
  • Conference Sponsors: ASME Nanotechnology Council
  • ISBN: 978-0-7918-4392-5 | eISBN: 978-0-7918-3866-2
  • Copyright © 2010 by ASME


New medical device technology is essential for diagnosing, monitoring, and curing wide spectrum of diseases, anomalies and inflictions. For neural applications, no matter whether non-intrusive or not, currently available devices are generally limited to either a curing or a probing function. In this paper we review the technology requirements for new neural probe and cure device technology. Recent advances in micro and nano-scale devices engineering and wireless power technology offer a great potential to revolutionize many health care systems. The integration of wireless power technology into smart microsensor and probe systems greatly simplifies the healthcare devices and systems and also offers additional device functions for even complex jobs. The wireless power feed technology eliminates the pains and irritations associated with implanted power devices and wires. Neural electronics interfaces (NEI) can be coupled and integrated with the wireless power receiver (WPR). The implantable probe-pin devices (PPD) that include the NEI and WPR allow real-time measurement and control/feedback possible for remedial process of neural anomaly from normal functions. Such a system like a PPD should have an embedded expert system that performs semi-autonomous functions through a routine of sensing, judging, and controlling the neural anomaly.

Copyright © 2010 by ASME
Topics: Probes



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