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Anisotropic Thermal Diffusivity Measurements in Nanostructured Samples Using a Photothermoelectric Technique

[+] Author Affiliations
Youngsuk Son, Monalisa Mazumder, Theodorian Borca-Tasciuc

Rensselaer Polytechnic Institute

Paper No. IMECE2006-16296, pp. 603-605; 3 pages
  • ASME 2006 International Mechanical Engineering Congress and Exposition
  • Heat Transfer, Volume 1
  • Chicago, Illinois, USA, November 5 – 10, 2006
  • Conference Sponsors: Heat Transfer Division
  • ISBN: 0-7918-4784-5 | eISBN: 0-7918-3790-4
  • Copyright © 2006 by ASME


Knowledge of the thermal transport properties in thin films and nanostructures is critical for a wide range of applications in microelectronics, photonics, micro-electro-mechanical-systems, and thermoelectrics. The last twenty years have seen significant developments in thin-film thermal characterization techniques. Despite these advances, the characterization of the thermal transport properties in low-dimensional systems remains a challenging task. Recently, thermal properties of nanowire/nanotube nanocomposites such as thermoelectric nanowires and aligned carbon nanotubes (CNT) deposited on silicon substrates or in alumina or polymer matrix have attracted a great interest due to their possible applications in high efficiency thermoelectric energy conversion and thermal management applications. However, a major challenge for thermal characterization of nanowire/nanotube composites is their thermal anisotropy. This work presents measurements of anisotropic thermal properties using a photothermoelectric technique.

Copyright © 2006 by ASME



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