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Coincidence Gate Utilization Factors for Neutron Correlation Counters With Up to Three Components in the Die-Away Profile

[+] Author Affiliations
S. Croft, R. D. McElroy, S. C. Kane

Canberra Industries, Inc., Meriden, CT

Paper No. ICEM2007-7173, pp. 281-284; 4 pages
  • The 11th International Conference on Environmental Remediation and Radioactive Waste Management
  • 11th International Conference on Environmental Remediation and Radioactive Waste Management, Parts A and B
  • Bruges, Belgium, September 2–6, 2007
  • Conference Sponsors: Nuclear Division and Environmental Engineering Division
  • ISBN: 978-0-7918-4339-0 | eISBN: 0-7918-3818-8
  • Copyright © 2007 by ASME


We present analytical expressions for the gate utilization factors (GUFs), up to fourth order, for both signal triggered and random triggered histograms based on a three-component capture time profile. These are useful for refined design performance calculations of passive neutron multiplicity counters using shift register correlation analysis. To our knowledge, these expressions are new.

Copyright © 2007 by ASME



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