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Non-Intrusive Unilateral Measurements of Void Incidence Within a Microchannel

[+] Author Affiliations
Douglas Heymann, Jordan Young, Ruander Cardenas

Oregon State University, Corvallis, OR

Paper No. IMECE2007-42009, pp. 823-833; 11 pages
  • ASME 2007 International Mechanical Engineering Congress and Exposition
  • Volume 7: Engineering Education and Professional Development
  • Seattle, Washington, USA, November 11–15, 2007
  • Conference Sponsors: ASME
  • ISBN: 0-7918-4301-7 | eISBN: 0-7918-3812-9
  • Copyright © 2007 by ASME


Void fraction measurements are used to characterize two-phase flow within a microchannel. Limitations of typical void fraction measurement systems include disruption of the flow (intrusive optical probe) and non-continuous data acquisition. Using the principles of total internal reflection, a Non-Intrusive Void Incidence Sensor (NIVIS) has been developed to determine the void incidence (frequency of a vapor bubble passing a known position in the channel). Continuous data can be recorded with a typical computer. A light beam is introduced through a fiber optic to the outside of a transparent channel wall at a critical angle. This critical angle is designed such that when a vapor bubble is present at the specified location, total internal reflection will occur. An output fiber is fixed in a determined position to receive light in the case of total internal reflection. Without the presence of a vapor bubble, the light beam will be reflected past the output fiber. A substantial increase in output signal is noticed when total internal reflection occurs. Characteristics of the NIVIS, proven during non-intrusive testing, include: continuous data acquisition of bubble incidences, measurements within a 100 micron wide channel, and bubble boundary differentiation.

Copyright © 2007 by ASME



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