0

Full Content is available to subscribers

Subscribe/Learn More  >

Fabrication of TiO2 and SiO2 Thin Films by Room Temperature Liquid Phase Deposition

[+] Author Affiliations
Santosh K. Tiwari, Brian K. Paul

Oregon State University, Corvallis, OR

Paper No. MSEC2007-31093, pp. 629-634; 6 pages
doi:10.1115/MSEC2007-31093
From:
  • ASME 2007 International Manufacturing Science and Engineering Conference
  • ASME 2007 International Manufacturing Science and Engineering Conference
  • Atlanta, Georgia, USA, October 15–18, 2007
  • Conference Sponsors: Manufacturing Division
  • ISBN: 0-7918-4290-8 | eISBN: 0-7918-3809-9
  • Copyright © 2007 by ASME

abstract

Mesoporous and dense titanium dioxide (TiO2 ) and silicon dioxide (SiO2 ) films were deposited directly from nanoparticle colloidal suspensions on quartz using a liquid phase deposition technique. The quartz surface was pre-treated with an -OH group to activate the deposition surface for crack-free adhesion. The deposited films were characterized with the help of scanning electron microscope for microstructural evaluation. An optical profilometer was used to measure the optical properties of the SiO2 film. The reflectance and transmittance patterns of the film were analyzed to determine the index of refraction of the film.

Copyright © 2007 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In