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A Dynamic Model of Microscale Contact Breaking in RF MEMS Switches

[+] Author Affiliations
Gavin Gee, Brian D. Jensen

Brigham Young University, Provo, UT

Paper No. IJTC2006-12297, pp. 1475-1479; 5 pages
doi:10.1115/IJTC2006-12297
From:
  • STLE/ASME 2006 International Joint Tribology Conference
  • Part B: Magnetic Storage Tribology; Manufacturing/Metalworking Tribology; Nanotribology; Engineered Surfaces; Biotribology; Emerging Technologies; Special Symposia on Contact Mechanics; Special Symposium on Nanotribology
  • San Antonio, Texas, USA, October 23–25, 2006
  • Conference Sponsors: Tribology Division
  • ISBN: 0-7918-4259-2 | eISBN: 0-7918-3789-0
  • Copyright © 2006 by ASME

abstract

For many applications, radio frequency microelectromechanical systems (RF MEMS) switches require very fast switching times so that they are capable of switching thousands of times each second. Contact adhesion tends to slow switches by increasing the time required to break the contact and open the switch. Previous work showed that typical switches have a contact opening time exceeding 1 ms, which is far too slow for many applications. This paper presents a dynamic, transient model to predict the time required to break the contact. The model considers both the motion of the switch body and the adhesion at the contact. The model has been validated by comparing it to experimental data. The model shows that vibrations in the switch body can be instrumental in dramatically reducing contact opening time by a factor of nearly 1000, leading to acceptable switch speeds.

Copyright © 2006 by ASME

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