0

Full Content is available to subscribers

Subscribe/Learn More  >

Comparison of Thermal Performance of Current High-End Thermal Interface Materials

[+] Author Affiliations
Gamal Refai-Ahmed

AMD Inc., Markham, ON, Canada

Zhaojuan He, Ellen Heian, Ramzi Vincent, Tim Rude, David Van Heerden

Reactive NanoTechnologies, Hunt Valley, MD

Paper No. IPACK2007-33383, pp. 399-403; 5 pages
doi:10.1115/IPACK2007-33383
From:
  • ASME 2007 InterPACK Conference collocated with the ASME/JSME 2007 Thermal Engineering Heat Transfer Summer Conference
  • ASME 2007 InterPACK Conference, Volume 1
  • Vancouver, British Columbia, Canada, July 8–12, 2007
  • Conference Sponsors: Electronic and Photonic Packaging Division
  • ISBN: 0-7918-4277-0 | eISBN: 0-7918-3801-3
  • Copyright © 2007 by ASME

abstract

Reactive NanoTechnologies (RNT) has developed a reactive bonding technology to directly bond silicon dies to heat sinks with indium solder using a reactive multilayered foil. In this new method of bonding, heat is generated locally by exothermic mixing within the multilayered foil. This heat is used to melt indium solder layers to join the dies to the heat sinks. The measured thermal resistance of the resulting solder bond is 4 to 5 K mm2 /W (0.006 to 0.008 K in2 /W). In addition, the reactive foil also localizes the heat to the interface, thus minimizing residual stress and thermal damage in the components. In this paper we discuss the thermal performance and reliability test results for reactive multilayer bonding with different bond line thicknesses. We also present detailed comparisons of thermal performance between reactive multilayer bonding and other current Thermal Interface Material (TIM) solutions, including polymer-based greases, phase change materials, and low melting metallic alloy. Benchmark tests were done using the graphics processor on an operational video card as a test vehicle. The test results show that the introduction of a reactive multilayer bond as an interface material between the graphics processor and the thermal management device demonstrates significant performance advantages over any of the other current commercially available TIM solutions.

Copyright © 2007 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In