0

Full Content is available to subscribers

Subscribe/Learn More  >

Aerospace Micro-Nano-Technology High Technology-Readiness-Level Acceleration Using Directed Patent Information Analysis

[+] Author Affiliations
George Kapsalas

Registered Patent Agent, Athens, Greece

Paper No. CANEUS2006-11075, pp. 339-346; 8 pages
doi:10.1115/CANEUS2006-11075
From:
  • CANEUS 2006: MNT for Aerospace Applications
  • CANEUS2006: MNT for Aerospace Applications
  • Toulouse, France, August 27–September 1, 2006
  • Conference Sponsors: Nanotechnology Institute
  • ISBN: 0-7918-4254-1 | eISBN: 0-7918-3787-4
  • Copyright © 2006 by ASME

abstract

Micro-Nano-technology (MNT) development efforts for aerospace applications face significant challenges in rapidly and efficiently transitioning aerospace MNT development from the low technology-readiness-level (TRL) stage found primarily in the research and development community to a mid and high TRL within the systems developer community. This paper explores and highlights some opportunities for more efficiently linking these two TRL stages using directed international patent information analysis as a core method. Possible injection of systematic methodologies of patent information analysis at certain points of a project development flow are suggested. Practical case examples in aerospace MNT suggest that such analysis may have significant potential to qualitatively enhance frameworks for accelerated transitioning of aerospace MNT development to the high TRL stage and to commercialization.

Copyright © 2006 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In