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Aerospace Micro-Nano-Technology High Technology-Readiness-Level Acceleration Using Directed Patent Information Analysis

[+] Author Affiliations
George Kapsalas

Registered Patent Agent, Athens, Greece

Paper No. CANEUS2006-11075, pp. 339-346; 8 pages
  • CANEUS 2006: MNT for Aerospace Applications
  • CANEUS2006: MNT for Aerospace Applications
  • Toulouse, France, August 27–September 1, 2006
  • Conference Sponsors: Nanotechnology Institute
  • ISBN: 0-7918-4254-1 | eISBN: 0-7918-3787-4
  • Copyright © 2006 by ASME


Micro-Nano-technology (MNT) development efforts for aerospace applications face significant challenges in rapidly and efficiently transitioning aerospace MNT development from the low technology-readiness-level (TRL) stage found primarily in the research and development community to a mid and high TRL within the systems developer community. This paper explores and highlights some opportunities for more efficiently linking these two TRL stages using directed international patent information analysis as a core method. Possible injection of systematic methodologies of patent information analysis at certain points of a project development flow are suggested. Practical case examples in aerospace MNT suggest that such analysis may have significant potential to qualitatively enhance frameworks for accelerated transitioning of aerospace MNT development to the high TRL stage and to commercialization.

Copyright © 2006 by ASME



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