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Variation Simulations for Digital Panel Assembly

[+] Author Affiliations
Wayne Cai, Yufeng Long, Ching Hsieh

General Motors Corporation

Paper No. IMECE2003-42405, pp. 391-414; 24 pages
doi:10.1115/IMECE2003-42405
From:
  • ASME 2003 International Mechanical Engineering Congress and Exposition
  • Manufacturing
  • Washington, DC, USA, November 15–21, 2003
  • Conference Sponsors: Manufacturing Engineering Division
  • ISBN: 0-7918-3720-3 | eISBN: 0-7918-4663-6, 0-7918-4664-4, 0-7918-4665-2
  • Copyright © 2003 by ASME

abstract

This paper presents methodologies and results of variation simulations for digital panel assembly, using GM proprietary software called EAVS. EAVS provides two alternative algorithms for variation simulation of digital panel assembly, i.e., Taylor Series Expansion (TSE) based and Monte Carlo Simulation (MCS) based. In this paper, algorithms of the two methods are reviewed, and pros and cons are studied. Several case studies are presented to illustrate the capabilities of the two methods. Based on the case studies, the EAVS variation simulation guidelines will be established ensuring analysis accuracy at reasonable computational time.

Copyright © 2003 by ASME

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