Full Content is available to subscribers

Subscribe/Learn More  >

Quantitative Assessment of Penetration Depth in Clinical Ultrasound Systems

[+] Author Affiliations
Franco Marinozzi, Fabiano Bini, Federico Patanè, Daniele Piras

University of Rome “La Sapienza”, Roma, Italy

Paper No. BioMed2007-38040, pp. 105-106; 2 pages
  • ASME 2007 2nd Frontiers in Biomedical Devices Conference
  • ASME 2007 2nd Frontiers in Biomedical Devices
  • Irvine, California, USA, June 7–8, 2007
  • Conference Sponsors: Nanotechnology Institute
  • ISBN: 0-7918-4266-5 | eISBN: 0-7918-3797-1
  • Copyright © 2007 by ASME


Most of the recent studies for image uniformity assessment involve signal to noise ratio (SNR) analysis computed over various combinations of mean grey level and variance [1–2] to quantify the speckle contrast and hence the depth of penetration (DOP). Speckle is auto correlated in time but not in space. Electronic noise always present at the bottom of the image, instead, is uncorrelated both in time and space. The extension of the area in which only the speckle is visible, gives an estimate of the penetration depth. The correlation coefficient of two subsequently acquired frames can be computed to quantify image uniformity where depth at which the correlation coefficient falls below a fixed threshold is defined as penetration depth.

Copyright © 2007 by ASME



Interactive Graphics


Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In