0

Full Content is available to subscribers

Subscribe/Learn More  >

Transition From MEMS Technology to Nanofabrication

[+] Author Affiliations
T. Glinsner, P. Lindner, P. Kettner, H. Kirchberger

EV Group, St. Florian, Austria

Paper No. MNC2007-21337, pp. 1655-1659; 5 pages
doi:10.1115/MNC2007-21337
From:
  • 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems
  • First International Conference on Integration and Commercialization of Micro and Nanosystems, Parts A and B
  • Sanya, Hainan, China, January 10–13, 2007
  • Conference Sponsors: Nanotechnology Institute
  • ISBN: 0-7918-4265-7 | eISBN: 0-7918-3794-7
  • Copyright © 2007 by ASME

abstract

The successful commercialization of Micro-Electro-Mechanical Systems (MEMS) from R&D to off-the-shelf products and systems has evolved from laboratory research to reliable and low cost industrial processing methods over the past 20 years. Standardization, infrastructure, roadmaps and industrial associations have been deemed key contributors for a successful transition and adaptation of microelectronics fabrication techniques to a specific nature of manufacturing MEMS devices resulted in turn key solutions for low cost, high yield and high volume wafer level processing. The need for smaller feature sizes as well as low cost manufacturing solutions has lead to significant improvements of the classical optical lithography in the past two decades following Moore’s law. Alternative patterning techniques are under development worldwide for producing patterns in the nm-range. There are similarities between MEMS and Nanofabrication requirement that allow for transitioning standardized and reliable processing technology from wafer bonding to hot embossing and from wafer level packaging to μ-CP and UV-based Nanoimprint Lithography.

Copyright © 2007 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In