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Spatio-Temporal Mapping of Transient Electric Fields With an Ultrafast Scanning Tunneling Microscope

[+] Author Affiliations
Tian Lan, Guoqiang Ni

Beijing Institute of Technology, Beijing, China

Paper No. MNC2007-21323, pp. 1615-1619; 5 pages
  • 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems
  • First International Conference on Integration and Commercialization of Micro and Nanosystems, Parts A and B
  • Sanya, Hainan, China, January 10–13, 2007
  • Conference Sponsors: Nanotechnology Institute
  • ISBN: 0-7918-4265-7 | eISBN: 0-7918-3794-7
  • Copyright © 2007 by ASME


In this paper, we report experimental results of spatio-temporal mapping of electrical transients scanned in strip direction with an ultrafast scanning tunneling microscope. The transients are pumped by ultrashort laser pulses with duration of 100 fs and a wavelength of 800 nm on a coplanar strip line sample. The signals on a coplanar strip line were measured in both contact and non-contact mode. The resolved transient signal showed a full width at half maximum (FWHM) pulse width of 1.2 ps. The pulses propagate along the CPS at a speed of about 2/3 of the light velocity. The spatial resolution image of the gold surface on the transmission line acquired with the tip by the STM under ambient condition has a resolution on the order of 20 nm.

Copyright © 2007 by ASME



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