0

Full Content is available to subscribers

Subscribe/Learn More  >

Research on the Fabrication Time and Surface Quality of the Plane Model in the Two-Photon Three Dimension Microfabrication

[+] Author Affiliations
Peng Wei, Yu Zhu, Guanghong Duan

Tsinghua University, Beijing, China

Paper No. MNC2007-21259, pp. 1363-1368; 6 pages
doi:10.1115/MNC2007-21259
From:
  • 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems
  • First International Conference on Integration and Commercialization of Micro and Nanosystems, Parts A and B
  • Sanya, Hainan, China, January 10–13, 2007
  • Conference Sponsors: Nanotechnology Institute
  • ISBN: 0-7918-4265-7 | eISBN: 0-7918-3794-7
  • Copyright © 2007 by ASME

abstract

The comprehensive evaluation index was introduced to reduce the fabrication time and improve the surface quality of the two-photon three dimension microfabrication. And the relation between the exposure time and the overlap rate with the fabrication time and the surface quality was described in detail. The objective function based on the evaluation index was given. And the Genetic Algorithm was applied in searching the optimal solution of the objective function. Simulation results indicate that the method is useful to some extent.

Copyright © 2007 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In