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PZT Film and Si Substrate Two-Layer System Patterning Morphology by Femtosecond Pulsed Laser

[+] Author Affiliations
Shizhou Xiao, Rui Guo, Yalei Wu, Wenhao Huang, Jiaru Chu

USTC-Hefei, Hefei, China

Guanghua Cheng

Xi’an Institute of Optics and Precision Mechanisms, Xi’an, China

Paper No. MNC2007-21186, pp. 1309-1314; 6 pages
doi:10.1115/MNC2007-21186
From:
  • 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems
  • First International Conference on Integration and Commercialization of Micro and Nanosystems, Parts A and B
  • Sanya, Hainan, China, January 10–13, 2007
  • Conference Sponsors: Nanotechnology Institute
  • ISBN: 0-7918-4265-7 | eISBN: 0-7918-3794-7
  • Copyright © 2007 by ASME

abstract

In this paper, a novel PZT film patterning method by femtosecond laser is proposed. The method is different from traditional dry-etching and wet-etching technology. Femtosecond laser microfabrication technology has several advantages such as high resolution, no mask direct-writing and seldom-heating, etc. A two-layer (PZT thin film and substrate) heating and ablating threshold model is built and the relationship of PZT/Si two-layer system micro ablation morphology depending on laser pulse energy is constructed. From the model and experiment data, we obtain the suitable energy region to pattern PZT film freely without damage Si substrate. A 3μm resolution of PZT pattern is achieved in our experiment. In order to verify the fabrication available of this technology, several micro functional devices are successfully patterned by optimized femtosecond pulsed laser energy and their function are detected. The results prove that the PZT patterning quality is good.

Copyright © 2007 by ASME
Topics: Lasers

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