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Wire Fatigue Models for Power Electronic Modules

[+] Author Affiliations
Karumbu Nathan Meyyappan, Patrick McCluskey

University of Maryland, College Park, MD

Peter Hansen

Grundfos Management A/S, Bjerringbro, Denmark

Paper No. IMECE2003-42007, pp. 257-265; 9 pages
doi:10.1115/IMECE2003-42007
From:
  • ASME 2003 International Mechanical Engineering Congress and Exposition
  • Electronic and Photonic Packaging, Electrical Systems and Photonic Design, and Nanotechnology
  • Washington, DC, USA, November 15–21, 2003
  • Conference Sponsors: Electronic and Photonic Packaging Division
  • ISBN: 0-7918-3714-9 | eISBN: 0-7918-4663-6, 0-7918-4664-4, 0-7918-4665-2
  • Copyright © 2003 by ASME

abstract

This paper presents two, semi-analytical, physics-of-failure based life prediction model formulations for flexural failure of wires ultrasonically wedge bonded to pads at different heights. The life prediction model consists of a load transformation model and a damage model. The load transformation model determines the cyclic strain is created by a change in wire curvature at the heel of the wire resulting from expansion of the wire and displacement of the frame. The damage model calculates the life based on the strain cycle magnitude and the elastic-plastic fatigue response of the wire. The first formulation provides quick calculation of the time to failure for a wire of known geometry. The second formulation optimizes the wire geometry for maximum time to failure. These model formulations support virtual qualification of power modules where wire flexural fatigue is a dominant failure mechanism. The model has been validated using temperature cycling test results.

Copyright © 2003 by ASME
Topics: Fatigue , Wire

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