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On ALT and Field Reliability: Challenges and Solutions

[+] Author Affiliations
Zhengfang Qian, Joe Tomase

Motorola, Inc., Schaumburg, IL

Paper No. IMECE2003-41668, pp. 63-69; 7 pages
  • ASME 2003 International Mechanical Engineering Congress and Exposition
  • Electronic and Photonic Packaging, Electrical Systems and Photonic Design, and Nanotechnology
  • Washington, DC, USA, November 15–21, 2003
  • Conference Sponsors: Electronic and Photonic Packaging Division
  • ISBN: 0-7918-3714-9 | eISBN: 0-7918-4663-6, 0-7918-4664-4, 0-7918-4665-2
  • Copyright © 2003 by ASME


This paper presents a critical overview of the current state-of-the-art of Accelerated Reliability Tests (ALTs) and field reliability. Investigations have been focused on a few critical issues, including test philosophy, test physics, test procedure, and test statistics. It has been identified that there is a huge gap between ALT and field reliability. Challenges and solutions include bridging gap between deterministic and statistical approaches, identifying failure modes/mechanisms and their interaction, making scientific judgement of complicated ALT procedures, determining sample size and targeted failure rate for test plans, building databases of ALT and field reliability for knowledge discovery, and developing powerful and integrated tools for virtual qualification and reliability prediction.

Copyright © 2003 by ASME
Topics: Reliability



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