0

Full Content is available to subscribers

Subscribe/Learn More  >

Molecular Dynamics Simulation of Thermal Transport at Nanometer Size Point Contacts on a Planar Silicon Substrate

[+] Author Affiliations
Sanjoy Saha, Li Shi

University of Texas at Austin, Austin, TX

Paper No. HT2005-72308, pp. 389-396; 8 pages
doi:10.1115/HT2005-72308
From:
  • ASME 2005 Summer Heat Transfer Conference collocated with the ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems
  • Heat Transfer: Volume 1
  • San Francisco, California, USA, July 17–22, 2005
  • Conference Sponsors: Heat Transfer Division and Electronic and Photonic Packaging Division
  • ISBN: 0-7918-4731-4 | eISBN: 0-7918-3762-9
  • Copyright © 2005 by ASME

abstract

A Non Equilibrium Molecular Dynamics (NEMD) simulation has been used to calculate the temperature distribution in the substrate side of a nanometer scale point contact on a planar silicon substrate with different doping concentrations and contact radii. The size of the non-uniform temperature zone was found to approach the average nearest-neighbor distance of impurity dopants when the contact radius was reduced below this distance. At a contact radius of 0.5 nm, the calculated spreading thermal resistance at the nano-point contact agrees with those obtained using two phonon transport models. At a contact radius between 1 nm and 6 nm, however, the spreading resistance from the NEMD is much larger than those from the two models that assume small deviation from the equilibrium distribution.

Copyright © 2005 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In