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Accelerated Reliability Methodologies for Electronic Components: A Case Study

[+] Author Affiliations
Nick Strifas, John Fraysse

NAVSEA Surface Warfare Center, Dahlgren, VA

Massimo Ruzzene

Catholic University of America, Washington, D.C.

Paper No. IMECE2002-39637, pp. 499-503; 5 pages
  • ASME 2002 International Mechanical Engineering Congress and Exposition
  • Electronic and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology
  • New Orleans, Louisiana, USA, November 17–22, 2002
  • Conference Sponsors: Electronic and Photonic Packaging Division
  • ISBN: 0-7918-3648-7 | eISBN: 0-7918-1691-5, 0-7918-1692-3, 0-7918-1693-1
  • Copyright © 2002 by ASME


The procedures of estimating the time to failure from accelerated test data are reviewed in this study. An accelerated life test approach which provides the desired reliability results for a fiber optic sensor in shorter times than would be possible with a test performed under normal stress conditions is presented. Utilizing ReliaSoft ALTA software the statistical and life distribution that describe the time to failure of the sensor is determined and the desired reliability results are calculated using the level probability density function.

Copyright © 2002 by ASME



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