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Experimental Evaluation on Solder Joint Reliability of PBGA Assembly Under Mechanical Drop Test

[+] Author Affiliations
Shi-Wei Ricky Lee, Yin-Lai Tracy Li, Hoi-Wai Ben Lui

Hong Kong University of Science and Technology, Kowloon, Hong Kong

Paper No. IMECE2002-39493, pp. 181-185; 5 pages
  • ASME 2002 International Mechanical Engineering Congress and Exposition
  • Electronic and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology
  • New Orleans, Louisiana, USA, November 17–22, 2002
  • Conference Sponsors: Electronic and Photonic Packaging Division
  • ISBN: 0-7918-3648-7 | eISBN: 0-7918-1691-5, 0-7918-1692-3, 0-7918-1693-1
  • Copyright © 2002 by ASME


The present study is intended to investigate the board level solder joint reliability of PBGA assemblies under mechanical drop test. During the course of this study, a five-leg experiment was designed to investigate various combinations of solder materials and peak reflow temperatures. Two major failure modes, namely, solder cracking and copper trace breakage, were identified. In addition, the critical location of solder joints was characterized. It was found that Sn-Pb eutectic solder joints performed better than Pb-free solder joints under mechanical impact loading.

Copyright © 2002 by ASME



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