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Thermal Characterization of Two Opposing Carbon Nanotube Arrays Using Diffraction-Limited Infrared Microscopy

[+] Author Affiliations
Xuejiao Hu, Matt Panzer, Kenneth E. Goodson

Stanford University

Paper No. IMECE2005-83005, pp. 835-839; 5 pages
  • ASME 2005 International Mechanical Engineering Congress and Exposition
  • Heat Transfer, Part B
  • Orlando, Florida, USA, November 5 – 11, 2005
  • Conference Sponsors: Heat Transfer Division
  • ISBN: 0-7918-4222-3 | eISBN: 0-7918-3769-6
  • Copyright © 2005 by ASME


Due to their extremely high thermal conductivity, carbon nanotubes (CNTs) have received many research interests for thermal management applications. An advanced thermal interface structure made by two opposing, partially over-lapped CNT arrays is designed for thermally connecting two contact surfaces. The performance of this interface structure is thermally characterized using diffraction-limited infrared microscopy. Significant temperature discontinuities are found at the end of the CNT-CNT contact region, which indicates a large thermal resistance between CNTs. Due to this inter-tube resistance, the thermal performance of the CNT-based interface structure is far below expectation, with a thermal resistance value of about 3.8 × 10−4 K·m2 /W. Possible mechanisms of heat transfer between CNTs, which result in the large inter-tube resistance, are discussed.

Copyright © 2005 by ASME



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