Full Content is available to subscribers

Subscribe/Learn More  >

Thermal Property Measurement of Semiconductor Melt Using Modified Laser Flash Method

[+] Author Affiliations
Bochuan Lin, Heng Ban, Chao Li, Rosalia N. Scripa

University of Alabama at Birmingham, Birmingham, AL

Shen Zhu, Ching-Hua Su, Sandor L. Lehoczky

NASA Marshall Space Flight Center, Huntsville, AL

Paper No. HT2003-47448, pp. 833-839; 7 pages
  • ASME 2003 Heat Transfer Summer Conference
  • Heat Transfer: Volume 1
  • Las Vegas, Nevada, USA, July 21–23, 2003
  • Conference Sponsors: Heat Transfer Division
  • ISBN: 0-7918-3693-2 | eISBN: 0-7918-3679-7
  • Copyright © 2003 by ASME


This study further develops the standard laser flash method for the measurement of multiple thermal properties of semiconductor melts. The standard laser flash method is widely used to measure thermal diffusivity of solids. Our modified procedure allows thermal diffusivity, thermal conductivity, and specific heat capacity of molten semiconductor material to be determined simultaneously. The transient heat transfer process in the melt and its quartz container was computationally studied in detail. A fitting procedure based on the numerical result and the least root-mean-square error fitting to the experimental data was used to extract thermal diffusivity, specific heat capacity, and thermal conductivity. The results for tellurium (Te) at 873 K: specific heat capacity 300.2 J/kg K, thermal conductivity 3.50 W/m K, thermal diffusivity 2.04×10−6 m2 /s, are in good agreement with data published in the literature. Furthermore, uncertainty analysis showed quantitatively the effect of sample geometry, transient temperature measured, and the energy of the laser pulse on the results.

Copyright © 2003 by ASME



Interactive Graphics


Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In