Full Content is available to subscribers

Subscribe/Learn More  >

Molecular Scale Imaging With a Mutlilayer Superlens

[+] Author Affiliations
P. Chaturvedi, N. Fang

University of Illinois at Urbana-Champaign, Urbana, IL

Paper No. NANO2005-87056, pp. 51-52; 2 pages
  • ASME 4th Integrated Nanosystems Conference
  • Design, Synthesis, and Applications
  • Berkeley, California, USA, September 12–14, 2005
  • Conference Sponsors: Nanotechnology Institute
  • ISBN: 0-7918-4208-8 | eISBN: 0-7918-3771-8
  • Copyright © 2005 by ASME


Recent theory [1] suggested a thin negative index film should function as a “superlens”, providing image detail with resolution beyond the diffraction limit—a limitation to which all positive index optics are subject. The superlens allows the recovery of evanescent waves in the image via the excitation of surface plasmons. It has been demonstrated experimentally [2] that a silver superlens allows to resolve features well below the working wavelength. Resolution as high as 60 nanometer (λ/6) half-pitch has been achieved. This unique class of superlens will enable parallel imaging and nanofabrication in a single snapshot, a feat that are not yet available with other nanoscale imaging techniques such as atomic force microscope or scanning electron microscope. In this paper, we explore the possibility of further refining the image resolution using a multilayer superlens [3]. Using a stable transfer matrix scheme, our numerical calculations show an ultimate imaging resolution of λ/24. This is made possible using alternating stacks of alumina (Al2 O3 ) and silver (Ag) layers to enhance a broad spectrum of evanescent waves via surface plasmon modes. Furthermore, we present the effect of alterations in number of layers and thickness to the image transfer function. With optimized design of multilayer superlens (working wavelength of 387.5nm), our study indicates the feasibility of resolving features of 16nm and below. Moreover, our tolerance analysis indicates that a 380 nm commercial light source would degrade slightly the imaging resolution to about 20nm. Preliminary experiments are ongoing to demonstrate the molecular scale imaging resolution. The development of potential low-loss and high resolution superlens opens the door to exciting applications in nanoscale optical metrology and nanomanufacturing.

Copyright © 2005 by ASME
Topics: Imaging



Interactive Graphics


Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In